Перегляд за автором "Prokopenko, I.V."

Результати 1-20 з 26

Наступна сторінка

CdSe nanoparticles grown with different chelates

Bacherikov, Yu.Yu.; Davydenko, M.O.; Dmytruk, A.M.; Dmitruk, I.M.; Lytvyn, P.M.; Prokopenko, I.V.; Romanyuk, V.R. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2006)

Modified reverse micelles method allowing fabrication of CdSe nanoparticles in toluene solution in series of sizes with average diameter from 1.2 to 3.2 nm and size distribution ∼ 12-30 % is presented. Simple empirical ...
Chlorin e6 combined with albumin nanoparticles as a potential composite photosensitizer for photodynamic therapy of tumors

Shton, I.O.; Sarnatskaya, V.V.; Prokopenko, I.V.; Gamaleia, N.F. (Experimental Oncology, 2015)

Aim: To synthesize and to study for photodynamic activity a composite photosensitizer consisting of chlorin e6 and human serum albumin nanoparticles (HSA NPs). Materials and Methods: Starting from sorption-purified HSA, ...
Chronobiological approaches to antiangiogenic photodynamic therapy of tumors: the first experimental evaluatIon

Gamaleia, N.F.; Lisnyak, I.A.; Shishko, E.D.; Mamchur, A.A.; Prokopenko, I.V.; Kholin, V.V. (Experimental Oncology, 2012)

In research of the last decade, rhythmic (circadian) variations of vascular endothelial growth factor (VEGF) production by tumors were discovered. The present paper authors have earlier synthesized and characterized a new ...
Complex diffractometrical investigation of structural and compositional irregularities in GaAs:Si/GaAs films heavily doped with silicon

Datsenko, L.I.; Klad’ko, V.P.; Lytvyn, P.M.; Domagala, J.; Machulin, V.F.; Prokopenko, I.V.; Molodkin, V.B.; Maksimenko, Z.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2001)

Complex of X-ray diffractometrical investigations, both angular and spectral dependences of a reflectivity for quasi-forbidden reflections, enable not only to discover structural microdefects and to measure their radii r ...
Composite film structures containg ZnS, CdS nanoparticles prepared by MOC pyrolysis at low temperatures

Svechnikov, G.S.; Zavyalova, L.V.; Roshchina, N.N.; Prokopenko, I.V.; Berezhinsky, L.I.; Khomchenko, V.S.; Litvin, O.S. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2004)

New composite structures containing ZnS, CdS nanoparticles were prepared with bright light-blue colour of a luminescence. The structures were formed by spraying organic solution of zinc or cadmium ditiocarbamate onto ...
Comprehensive investigation of defects in highly perfect silicon single crystals

Prokopenko, I.V.; Kislovskii, E.N.; Olikhovskii, S.I.; Tkach, V.M.; Lytvyn, P.M.; Vladimirova, T.P. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2000)

We used X-ray diffraction method of total rocking curves and nondestructive direct observation techniques (atomic force and scanning electron microscopies) to quantitatively determine the defect characteristics (radii and ...
Direct current transport mechanisms in n-InSe/p-CdTe heterostructure

Gorley, P.M.; Prokopenko, I.V.; Grushka, Z.M.; Makhniy, V.P.; Grushka, O.G.; Chervinsky, O.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2008)

The authors created n-InSe/p-CdTe heterojunction by deposition over optical contact, investigated temperature evolution of its current-voltage dependences under the forward bias, and determined the prevailing current ...
Domino phase retrieval algorithm for structure determination using electron diffraction and high resolution transmission electron microscopy patterns

Chukhovskii, F.N.; Poliakov, A.M.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)

Direct method formalism to determine atomic structures using the electron diffraction data is here aimed at a general solution of the phase retrieval problem, consequently combining the electron diffraction (ED) and the ...
Effect of microwave electromagnetic radiation on the structure, photoluminescence and electronic properties of nanocrystalline silicon films on silicon substrate

Kaganovich, E.B.; Kizyak, I.M.; Kirillova, S.I.; Konakova, R.V.; Lytvyn, O.S.; Lytvyn, P.M.; Manoilov, E.G.; Primachenko, V.E.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2003)

We studied the effect of microwave electromagnetic radiation on silicon low-dimensional structures. The nanocrystalline silicon (nc-Si) films on p-Si substrate were formed with pulsed laser ablation. The surface morphology ...
Effect of neutron irradiation and doping level on defect structure formation in gallium arsenide crystals

Seitmuratov, M.S.; Klad'ko, V.P.; Gudymenko, O.I.; Datsenko, L.I.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2002)

Using the technique of diffuse x-ray scattering at the "tails" of diffraction reflection curves, we analyze the effect of irradiation of dislocation GaAs crystals with high-energy neutrons on evolution of radiation clusters ...
Influence of absorption level on mechanisms of Braggdiffracted x-ray beam formation in real silicon crystals

Klad'ko, V. P.; Grigoriev, D.O.; Datsenko, L.I.; Machulin, V.F.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 1999)

The methods of numerical calculations based on the formulae of the X-ray dynamic scattering theory by real crystals and of the Takagi-Topin equations were used for investigation of the basic regularities of inherent to the ...
Investigation of growth conditions, crystal structure and surface morphology of SmS films fabricated by MOCVD technique

Volodin, N.M.; Zavyalova, L.V.; Kirillov, A.I.; Svechnikov, S.V.; Prokopenko, I.V.; Khanova, A.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 1999)

The polycrystalline SmS films were fabricated by MOCVD technique using a number of ditiocarbamates, synthesized by different techniques. The growth kinetics and temperature dependencies of the film growth rate are investigated, ...
Light-induced mass transport in amorphous chalcogenides/gold nanoparticles composites

Trunov, M.L.; Lytvyn, P.M.; Nagy, P.M.; Oberemok, O.S.; Durkot, M.O.; Tarnaii, A.A.; Prokopenko, I.V.; Rubish, V.M. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2013)

We have established that mass-transport processes in two types of amorphous materials, based on light-sensitive inorganic compounds like Se and As₂₀Se₈₀ chalcogenide glasses (ChG), can be enhanced at the nanoscale in the ...
Mechanical scanning probe nanolithography: modeling and application

Lytvyn, P.M.; Lytvyn, O.S.; Dyachyns’ka, O.M.; Grytsenko, K.P.; Schrader, S.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2012)

The paper presents a study on modeling the mechanical interaction between the tip of a scanning atomic force microscope (AFM) and surfaces of various types, which makes it possible to optimize parameters and modes for ...
Microanalysis of magnetic structure of yttrium-iron garnet films by using the scanning probe microscopy methods

Synhaivska, O.I.; Lytvyn, P.M.; Yaremiy, I.P.; Kotsyubynsky, A.O.; Kozub, V.V.; Solnstev, V.S.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2016)

In this paper, the features of the microstructure of magnetic domains observed in ferrite-garnet films (FGF) have been presented. The studied FGF with orientation (111) were grown on gallium-gadolinium substrate by using ...
Nanoprobe spectroscopy of capillary forces and its application for a real surface diagnostics

Efremov, A.A.; Lytvyn, P.M.; Anishchenko, А.O.; Dyachyns’ka, O.M.; Aleksyeyeva, T.A.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2010)

The paper presents an overview and analysis of the most reliable and at the same time rather simple theoretical models describing liquid nanomeniscus geometry and forces occurring between atomic force microscope (AFM) ...
Ordering of lateral nonuniformity of TiBx film and transition layer in the TiBx-GaAs system

Konakova, R.V.; Milenin, V.V.; Voitsikhovskyi, D.I.; Kamalov, A.B.; Kolyadina, E.Yu.; Lytvyn, P.M.; Lytvyn, O.S.; Matveeva, L.A.; Prokopenko, I.V. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2001)

For TiBx film ~50 nm thick formed by magnetron sputtering from a pressed target onto the <100> GaAs substrate we experimentally revealed lateral nonuniformity ordering at microwave irradiation (frequency of 2.45 GHz, ...
Parameters of the energy spectrum for holes in CuInSe₂

Gorley, P.М.; Prokopenko, I.V.; Galochkinа, О.О.; Horley, P.P.; Vorobiev, Yu.V.; González-Hernández, J. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2009)

This paper reports the coefficients Ca,b for the k-linear term in dispersion relation E(k) for holes of the upper valence bands Г⁻₆ and Г⁺₇ in p-CuInSe₂ crystals. We also obtained the tensor components for the carrier ...
Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy

Sheremeta, T.I.; Prokopenko, I.V.; Lytvyn, P.M.; Lytvyn, O.S.; Vodop`yanov, V.M.; Bakhtinov, A.P.; Shyn`ko, E.I. (Functional Materials, 2007)

Peculiarities of PbTe nano-islet films formation on BaF₂ (111) fresh cleavages by hot wall epitaxy deposition have been investigated using atomic force microscopy. It has been shown that various growth mechanisms could be ...
Recrystallization processes in screen-printed CdS films

Klad’ko, V.P.; Lytvyn, O.S.; Lytvyn, P.M.; Osipenok, N.M.; Pekar, G.S.; Prokopenko, I.V.; Singaevsky, A.F.; Korchevoy, A.A. (Semiconductor Physics Quantum Electronics & Optoelectronics, 2002)

Kinetics of recrystallization in screen-printed polycrystalline CdS films has been investigated by X-ray structure analysis and optical microscopy. The relation between the crystallite size, crystallite orientation and the ...

Результати 1-20 з 26

Наступна сторінка

Пошук

Розширений пошук

Перегляд

Вся бібліотека

Перегляд за автором "Prokopenko, I.V."

Репозиторій DSpace/Manakin

Перегляд за автором "Prokopenko, I.V."

Пошук

Перегляд

Вся бібліотека

Мій обліковий запис